Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

27 results

Conference Proceedings

1. Does Strain Engineering Impact the Gate Stack Quality and Reliability?

C. Claeys ; E. Simoen ; F. Crupi ; G. Giusi

Pub. info.:	ULSI process integration 5. pp.101-114, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(6)

Conference Proceedings

2. Analysis of the Pre-epi Bake Conditions on the Defect Creation in Recessed SiGe S/D Junctions

M.B. Gonzalez ; N. Thomas ; E. Simoen ; P. Verheyen ; A. Hikavyy

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.47-53, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

Conference Proceedings

3. Influence of Fin Width on the Intrinsic Voltage Gain of Standard and Strained Triple-Gate nFinFETs

M.A. Pavanello ; J.A. Martino ; E. Simoen ; R. Rooyackers ; N. Collaert

Pub. info.:	Microelectonics Technology and Devices - SBMicro 2008. pp.253-261, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	14(1)

Conference Proceedings

4. Influence of the Drain Bias and Gate Length of Partially Depleted SOI MOSFETs on the ZTC Biasing Point

L.M. Camillo ; J.A. Martino ; E. Simoen ; C. Claeys

Pub. info.:	Microelectonics Technology and Devices - SBMicro 2008. pp.243-252, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	14(1)

Conference Proceedings

5. Origin and Suppression of Junction Leakage in Germanium-On-Silicon Structures

C. Claeys ; S. Sonde ; E. Simoen ; A. Satta ; B. De Jaeger ; G. Nicolas ; M. Meuris

Pub. info.:	Advanced gate stack, source/drain and channel engineering for Si-based CMOS 3 : new materials, processes and equipment. pp.31-40, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	6(1)

Conference Proceedings

6. Effect of Nitridatien on 1/f Noise in n-MOSFETs with High-k Dielectric

P. Srinivasan ; E. Simoen ; L. Pantisano ; C. L. Claeys ; D. Misra ; C. Rittersma

Pub. info.:	Physics and technology of high-k gate dielectrics III. pp.681-692, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(5)

Conference Proceedings

7. Impact of Millisecond Laser Anneal on the Thermal Stress- Induced Defect Creation in Si_1-xGe_x Source /Drain Junctions

M.B. Gonzalez ; E. Simoen ; E. Rosseel ; P. Verheyen ; L. Souriau

Pub. info.:	Advanced gate stack, source/drain and channel engineering for Si-based CMOS 4 : new materials, processes and equipment. pp.23-30, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(1)

Conference Proceedings

8. Impact of Ge Doping on Si Substrate and Diode Characteristics

J. Vanhellemont ; J. Lauwaert ; J. Chen ; H. Vrielinck ; J.M. Rafi ; H. Ohyama ; E. Simoen ; D. Yang

Pub. info.:	Materials and devices for end-of-roadmap and beyond CMOS scaling : symposium held April 5-9, 2010, San Francisco, California. pp.73-78, 2010. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	1252

Conference Proceedings

9. High-k Gate Stack Engineering and Low Frequency Noise Performance

C. Claeys ; E. Simoen ; P. Srinivasan ; D. Misra

Pub. info.:	Dielectrics for nanosystems II: materials science, processing, reliability, and manufacturing. pp.287-300, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	2(1)

10.

Conference Proceedings

10. Low Temperature Operation of Undoped Body Triple-Gate FinFETs from an Analog Perspective

M. A. Pavanello ; J. A. Martino ; E. Simoen ; R. Rooyackers ; N. Collaert ; C. Claeys

Pub. info.:	Microelectronics Technology and Devices : SBMICRO 2007. pp.19-28, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	9(1)

27 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by:

Author: E. Simoen