1.

Conference Proceedings
Conference Proceedings
1. STUDY OF THE DEFECT LEVELS AND INTERFACE PROPERTIES OF CdTe AND CdS POLYCRYSTALLINE THIN FILMS
Abou-Elfotouh, F. ; Ashour, S. ; Alkuhaimi, S. A. ; Zhang, J. ; Dunlavy, D. J. ; Kazmerski, L. L.
Pub. info.: Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.335-340,  1992.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 238
2.

Conference Proceedings
Conference Proceedings
2. ROOM TEMPERATURE MEASUREMENT OF PHOTOLUMINESCENCE SPECTRA OF SEMICONDUCTORS USING AN FT-RAMAN SPECTROPHOTOMETER
Webb, J. D. ; Dunlavy, D. J. ; Ciszek, T. ; Ahrenkiel, R. K. ; Wanlass, M. W. ; Noufi, R. ; Vernon, S. M.
Pub. info.: Diagnostic techniques for semiconductor materials processing : Symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.233-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 324