1.

Conference Proceedings

Conference Proceedings
Dube, C. ; Kalej, J.P. ; Rajendran, S.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.459-464,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
2.

Conference Proceedings

Conference Proceedings
Hanoka, J. I. ; Dube, C. ; Sandstrom, D. B.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.553-560,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46
3.

Technical Paper

Technical Paper
Sim, L. ; Bethke, K. ; Jordan, N. ; Dube, C. ; Hoffman, J.
Pub. info.: 35th International Conference on Environmental Systems : SAE technical paper.  2005.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2005