Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany. Part1 pp.397-404, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.57-64, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering