1.

Conference Proceedings

Conference Proceedings
Hayashino,T. ; Taniguchi,Y. ; Yamada,T. ; Shioya,Y. ; Nagao,T. ; Yoshida,T. ; Doi,M. ; Shimasaku,K. ; Komiyama,Y. ; Nakata,F. ; Furusawa,H. ; Kimura,H. ; Ouchi,M. ; Aoki,T. ; Kodaira,K. ; Miyazaki,S. ; Takato,N. ; Yagi,M. ; Yasuda,N.
Pub. info.: Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany.  Part1  pp.397-404,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4008
2.

Conference Proceedings

Conference Proceedings
Iwasaki,Y. ; Doi,M. ; Shionoya,T. ; Okamoto,K.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.57-64,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
3.

Conference Proceedings

Conference Proceedings
Doi,M. ; Furusawa,H. ; Nakata,F. ; Okamura,S. ; Sekiguchi,M. ; Shimasaku,K. ; Takeyama,N.
Pub. info.: Optical astronomical instrumentation : 26-28 March, 1998, Kona, Hawaii.  Part 2  pp.646-657,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3355
4.

Technical Paper

Technical Paper
Murase,K. ; Doi,M. ; Fukuda,K. ; Okuyama,A. ; Hososno,N.
Pub. info.: A collection of technical papers.  pp.209-215,  1998.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA International Communications Satellite Systems Conference
Ser. no.: CP9802