1.

Conference Proceedings
Conference Proceedings
1. ANALYSIS AND COMPARISON OF ELF2 CONCENTRATION AND STRESS DISTRIBUTION IN UNDOPED LEC-GROWN SEMI-INSULATING GaAs INGOTS
Dobrilla, P. ; Blakemore, J.S.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.213-218,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69
2.

Conference Proceedings
Conference Proceedings
2. SPATIALK DISTRIBUTION OF NEUTRAL EL2 AS MEASURED OPTICALLY FOR THIN SEMI-IUSULATING GaAs WAFERS, AND RELEVANCE TO DEVICE PARAMETERS
Dobrilla, P. ; Blakemore, J. S. ; Gleason, K. R. ; McCamant, A. J.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.219-226,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46