1.

Conference Proceedings
Conference Proceedings
1. A Phenomenological Model for Accurate Determination of Relaxation and Ge Content in Si1-xGex Layers by Raman Line Shift and X-ray Diffractometry
Bhagavannarayana,G. ; Dietrich,B. ; Zaumseil,P. ; Dombrowski,K.F.
Pub. info.: Physics of - Semiconductor Devices -.  Part 1  pp.595-598,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316
2.

Conference Proceedings
Conference Proceedings
2. Multisensor mine signature measurements at the JRC
Fortuny-Guasch,J. ; Dietrich,B. ; Hosgood,B. ; Nesti,G. ; Dean,J.T. ; Sieber,A.J.
Pub. info.: Detection and remediation technologies for mines and minelike targets V : 24-28 April 2000, Orlando, USA.  Part2  pp.877-883,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4038
3.

Conference Proceedings
Conference Proceedings
3. Computer program for network level determination of pavement layer thicknesses
Fernando,E. ; Liu,W. ; Dietrich,B.
Pub. info.: GPR 2000 : proceedings of the eighth international conference on ground penetrating radar.  pp.194-199,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4084
4.

Conference Proceedings
Conference Proceedings
4. Raman Scattering in SiGe/Si Hetero Systems
Dietrich,B.
Pub. info.: Semiconductor Devices.  pp.517-524,  1996.  Bellingham, WA, New Delhi.  SPIE-The International Society for Optical Engineering — Narosa
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2733