1.

Conference Proceedings

Conference Proceedings
Singh,R. ; Chin,A.K. ; Zu,Q. ; Dabkowski,F.P. ; Jollay,R.A. ; Bull,D.J. ; Fanelli,J. ; Goodman,D.S. ; Roblee,J.W. ; Plummer,W.T.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.32-41,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945
2.

Conference Proceedings

Conference Proceedings
Mao,Y. ; Dabkowski,F.P. ; Po,H. ; Chin,A.K.
Pub. info.: Optical scanning systems: design and applications : 30-31 July, 1997, San Diego, California.  pp.300-307,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3131
3.

Conference Proceedings

Conference Proceedings
Dabkowski,F.P. ; Pendse,D.R. ; Barrett,R.J. ; Chin,A.K. ; Jollay,R. ; Clausen,E.M. ; Hughes,Jr.,L.C. ; Sanders,N.B.
Pub. info.: Semiconductor Lasers II.  pp.36-49,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2886
4.

Conference Proceedings

Conference Proceedings
Hu,C. ; Mahajan,S. ; Dabkowski,F.P. ; Pendse,D.R. ; Barrett,R.J. ; Chin,A.K.
Pub. info.: Semiconductor Lasers II.  pp.59-66,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2886
5.

Conference Proceedings

Conference Proceedings
Pendse,D.R. ; Chin,A.K. ; Dabkowski,F.P. ; Clausen,E.M.
Pub. info.: Semiconductor Lasers III.  pp.79-85,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3547