J.-M. Park ; S.-J. Kim ; P.-G. Kim ; D.-J. Yoon ; G. Hansen ; K. L. DeVries
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Reliability, packaging, testing, and characterization of MEMS/MOEMS VI : 23-24 January, 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
J.-M. Park ; P.-G. Kim ; J.-H. Jang ; S.-J. Kim ; D.-J. Yoon ; G. Hansen ; K. L. DeVries
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Nanoengineering : fabrication, properties, optics, and devices IV : 27-30 August 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2008. 2 pp.69323A-1-69323A-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Optics and photonics in global homeland security IV : 17-20 March, 2008, Orlando, Florida, USA. pp.69451P-1-69451P-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
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