1.

Conference Proceedings
Conference Proceedings
1. Evaluation of Etch Behavior of Doped Silicon in Wet Cleaning of Silicon Wafer
D. Sinha
Pub. info.: State-of-the-art program on compound semiconductors 46 (SOTAPOCS 46) and processes at the semiconductor/solution interface 2.  pp.621-628,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(2)
2.

Conference Proceedings
Conference Proceedings
2. Metal Contamination from Process Materials Used in Wet Cleaning of Silicon Wafer
D. Sinha
Pub. info.: Dielectrics for nanosystems II: materials science, processing, reliability, and manufacturing.  pp.91-100,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(1)
3.

Conference Proceedings
Conference Proceedings
3. Computational representation of lattice operators
D. Sinha ; E.R. Dougherty
Pub. info.: Nonlinear image processing VI : 6-9 February 1995, San Jose, California.  pp.168-175,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2424
4.

Conference Proceedings
Conference Proceedings
4. Computational representation of increasing lattice-valued image operators
D. Sinha ; E.R. Dougherty
Pub. info.: Neural, morphological, and stochastic methods in image and signal processing : 10-11 July 1995 San Diego, California.  pp.80-86,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2568