1.

Conference Proceedings
Conference Proceedings
1. MICROSTRUCTURAL ASPECTS OF NICKEL SILICIDE FORMATION IN EVAPORATED NICKEL-SILICON MULTILAYER THIN FILMS
Holloway, Karen ; Clevenger, Larry
Pub. info.: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.153-158,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 159
2.

Conference Proceedings
Conference Proceedings
2. Structural And Chemical Characterization Of Tungsten Gate Stack For 1Gb DRAM
Gluschenkov, Oleg ; Benediet, John ; Clevenger, Larry ; DeHaven, Patrick ; Dziobkowski, Chet ; Faltermeier, Johnathan ; Lin, Chenting ; McStay, Irene ; Wong, Keith
Pub. info.: Gate stack and silicide issues in silicon processing : symposium held April 25-27, 2000, San Francisco, California, U.S.A..  pp.C3.3-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 611