1.

Conference Proceedings
Conference Proceedings
1. Process Integration Evolution in Manufacturing Technologies for Flash Memories
De Santi, G. ; Clementi, C. ; Rebora, A.
Pub. info.: ULSI process integration : proceedings of the first international symposium.  pp.93-106,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-18
2.

Conference Proceedings
Conference Proceedings
2. An Analysis of the Effect of the Steps for Isolation Formation on STI Process Integration
Pavan, A. ; Brazzelli, D. ; Aiello, M. ; Capolupo, C. ; Clementi, C. ; Cremonesi, C. ; Ghetti, A.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.467-476,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-6
3.

Conference Proceedings
Conference Proceedings
3. Detection of metal segregation at the oxide-silicon interface
Polignano, M.L. ; Giussani, A. ; Caputo, D. ; Clementi, C. ; Pavia, G. ; Priolo, F.
Pub. info.: Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany.  pp.223-232,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-29
4.

Conference Proceedings
Conference Proceedings
4. Detection of Metal Contamination in Intemally Gettered Wafers
Polignano, M.L. ; Bacciaglia, P. ; Caputo, D. ; Clementi, C. ; Padovani, B. ; Priolo, F. ; Simpson, T.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.206-217,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20
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Conference Proceedings
Conference Proceedings
5. Electrical Characterization of Highly Reliable 80Å Oxide
Ghidini, G. ; Alessandri, M. ; Clementi, C. ; Drera, D.
Pub. info.: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.645-656,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-1