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11 results

Conference Proceedings

1. Impedance Studies of Oxygen Exchange on a Highly Oriented Thin Film Electrode of La0.5Sr0.5CoO3-Δ

Yang, Y. ; Chen, C. ; Luo, G. ; Ross, D. ; Chu, C. ; Jacobson, A.

Pub. info.:	Solid-State Ionic Devices II, ceramic sensors : proceedings of the International Symposium. pp.157-170, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-32

Conference Proceedings

2. Effect of First Wafer on the CD Bias in DARC/Poly Gate Structure

Chen, L. ; Singh, M. ; Kim, N-H. ; Chu, C. ; Chinn, J.

Pub. info.:	Plasma processing XIII : proceedings of the international symposium. pp.183-197, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-6

Conference Proceedings

3. Simultaneous Cycle-Time Reduction And Output Enhancement In a Fully Loaded Foundry Wafer Fab*

Ho, C.M. ; Chen, T.C. ; Hseih, P. ; Chu, C. ; Houn, E. ; Su, K.J. ; Wang, P.M. ; Yew, W.C. ; Sun, S.W.

Pub. info.:	Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology. pp.574-579, 2001. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2001-17

Technical Paper

4. In-Service Low Temperature Pumpability of Crankcase Lubricants- Effect of Viscosity Modifiers.

Bansal, J.G. ; Chu, C. ; Outten, E.F.

Pub. info.:	2004 International Fuels and Lubricants Meeting : SAE technical paper. 2004. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2004

Technical Paper

5. Mars Base Technology Program Overview

Chu, C. ; Hayati, S. ; Udomkesmalee, S. ; Lavery, D.

Pub. info.:	AIAA meeting papers on disc. 2005. [Reston, Va.]. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA Space Conference and Exposition
Ser. no.:	2005

Conference Proceedings

6. A novel approach for hot-spot removal for sub-100nm manufacturing [6349-99]

Ma, M. ; Anderson, M. ; Lai, W. ; Wu, C. ; Tsao, B. ; Chu, C. ; Lin, C. ; Chou, J. ; Tsai, S.

Pub. info.:	Photomask Technology 2006. pp.63492P-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6349

Conference Proceedings

7. Vertical GaN based light emitting diodes on metal alloy substrate for solid state lighting application [6134-31]

Doan, T. ; Chu, C. ; Chen, C. ; Liu, W. ; Chu, J ; Yeh, J ; Chen, H ; Fan, F ; Tran, C

Pub. info.:	Light-Emitting Diodes: Research, Manufacturing, and Applications X. pp.61340G-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6134

Conference Proceedings

8. Data processing of laser airborne depth mapping

Jian, H. ; Chen, W. ; Wang, Y. ; Chu, C.

Pub. info.:	Lidar Remote Sensing for Industry and Environment Monitoring III. pp.406-413, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4893

Conference Proceedings

9. Developing of laser airborne depth mapping in China

Chen, W. ; Lu, Y. ; Li, J. ; Jian, H. ; Cui, X. ; Yin, S. ; Wang, Y. ; Chu, C.

Pub. info.:	Lidar Remote Sensing for Industry and Environment Monitoring III. pp.414-421, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4893

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Conference Proceedings

10. Lithography process window enhancement using integrated design defect detection and fix [6283-100]

Su, B. ; Ma, M. ; Vikram, A. ; Volk, W. ; Du, H. ; Verma, G. ; Morse, R. ; Chu, C. ; Tsao, B. ; Lin, C. ; Chou, J. ; Tsai, S.

Pub. info.:	Photomask and Next-Generation Lithography Mask Technology XIII. pp.62830Q-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6283

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