1.

Conference Proceedings
Conference Proceedings
1. In-situ single-wavelength ellipsometer for a vacuum chamber
Chegal,W. ; Ye,S. ; Cho,H.M. ; Lee,Y.W. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.15-18,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
2.

Conference Proceedings
Conference Proceedings
2. MTF measurement of LCDs by a linear CCD imager: I. Monochrome case
Kim,T.H. ; Choe,O.S. ; Lee,Y.W. ; Cho,H.M. ; Lee,I.W.
Pub. info.: Optical manufacturing and testing II : 27-29 July 1997, San Diego, California.  pp.526-531,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3134
3.

Conference Proceedings
Conference Proceedings
3. Study on the Structures of Buried Type Capacitor for MCM (Multi-Chip-Module)
Yoo,ChanSei ; Cho,H.M. ; Kang,N.K. ; Kwak,S.B. ; Lee,W.S. ; Lim,W. ; Park,J.C.
Pub. info.: 2000 International Conference on High-Density Interconnect and Systems Packaging, 25-28 April 2000, The Adam's Mark Hotel, Denver, Colorado, USA.  pp.320-324,  2000.  Reston, VA, Bellingham, Wash..  IMAPS — SPIE-The International Society for Optical
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4217
4.

Conference Proceedings
Conference Proceedings
4. Characterization of Buried Resistor for RF MCM-C Design
Cho,H.M. ; Yoo,C.S. ; Lim,W. ; Lee,W.S. ; Kwak,S.B. ; Kang,N.K. ; Park,J.C.
Pub. info.: 2000 International Conference on High-Density Interconnect and Systems Packaging, 25-28 April 2000, The Adam's Mark Hotel, Denver, Colorado, USA.  pp.192-195,  2000.  Reston, VA, Bellingham, Wash..  IMAPS — SPIE-The International Society for Optical
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4217
5.

Conference Proceedings
Conference Proceedings
5. A New Technique for Measuring Radius of Curvature Using Half-Aperture Bidirectional Shearing Interferometer,
Lee,Y.W. ; Cho,H.M. ; Shin,D.J. ; Chung,Y.B. ; Lee,I.W.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part1  pp.225-226,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
6.

Conference Proceedings
Conference Proceedings
6. Equipment for Real Time MTF Testing of Copier and Fax Lenses,
Cho,H.M. ; Lee,Y.W. ; Chung,Y.B. ; Lee,I.W. ; Kim,T.H. ; Choe,O.S.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part1  pp.119-120,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
7.

Conference Proceedings
Conference Proceedings
7. Determination of microstructure-related optical constants of titanium dioxide thin films using optical methods
Kim,S.Y. ; Kim,H.J. ; Cho,H.M. ; Lee,Y.W.
Pub. info.: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.234-237,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2873