1.

Conference Proceedings
Conference Proceedings
1. Formation and Annihilation of Epitaxial Stacking Faults Generated from Pre-Existing Nucleation Sites in Silicon
Cho,C.R. ; Noh,K.Y. ; Lee,D.H. ; Kim,Y.S. ; Ko,S.W. ; Kim,C.W. ; Kim,D.H. ; Son,C.B. ; Kim,S.J. ; Cho,D.H. ; Choi,J.J. ; Kim,D.J. ; Bae,K.M. ; Rozgonyi,G.A.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.201-208,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings
Conference Proceedings
2. Determination of Strain from Holographic Interferometric Fringe Analysis,
Park,S.O. ; Kim,H.S. ; Cho,D.G. ; Kwon,H.H. ; Cho,D.H.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part2  pp.1186-1187,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778