1.

Conference Proceedings
Conference Proceedings
1. Azimuth calibration method in ellipsometer with imaging spectrograph
Chegal, W. ; Cho, Y.J. ; Kim, H.J. ; Cho, H.M. ; Lee, Y.W. ; Kim, S.H.
Pub. info.: Imaging spectrometry X : 2-4 August 2004, Denver, Colorado, USA.  pp.400-405,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5546
2.

Conference Proceedings
Conference Proceedings
2. Determination of optical properties of titanium dioxide thin films on different substrates by using spectroscopic ellipsometry
Kim, H.J. ; Cho, Y.J. ; Cho, H.M. ; Chegal, W. ; Lee, Y.W. ; Kim, S.Y.
Pub. info.: Optical constants of materilas for UV to x-ray wavelengths : 4-5 August 2004, Denver, Colorado, USA.  pp.165-171,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5538