Rankin, J.E. ; Hill, M.R. ; Halpin, J. ; Chen, H.-L. ; Hackel, L.A. ; Harris, F.
Pub. info.:
ECRS 6 : proceedings of the 6th European Conference on Residual Stresses, Coimbra, Portugal, 10-12 July, 2002. pp.95-100, 2002. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Metrology, Inspection, and Process Control for Microlithography XVI. Part Two pp.696-705, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering