1.

Conference Proceedings
Conference Proceedings
1. Influence of the emitter-base junction depth on the low-frequency noise of Si/SiGeC heterojunction bipolar transistors
Benoit, P. ; Chay, C. ; Delseny, C. ; Pascal, F. ; Llinares, P. ; Vildeuil, J.-C. ; Baudry, H.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.242-250,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
2.

Conference Proceedings
Conference Proceedings
2. Comparison of low-frequency noise in III-V and Si/SiGe HBTs (Invited Paper)
Pascal, F. ; Guenard-Jarrix, S. ; Delseny, C. ; Penarier, A. ; Chay, C. ; Deen, M.J.
Pub. info.: Noise in Devices and Circuits.  pp.133-146,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113