1.

Conference Proceedings
Conference Proceedings
1. *METASBLE DEFECT IN SILICON
Chantre, A.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.37-46,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
2.

Conference Proceedings
Conference Proceedings
2. PULSED ELECTRON BEAM ANNEALING INDUCED DEEP LEVEL DEFECTS IN VIRGIN SILICON
Barbier, D. ; Kechouane, M. ; Chantre, A. ; Laugier, A.
Pub. info.: Laser-solid interactions and transient thermal processing of materials : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.449-454,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 13
3.

Conference Proceedings
Conference Proceedings
3. *ELECTRICAL PROPERTIES OF EPITAXIAL SILICIDE-SILICON INTERFACES
Tung, R.T. ; Levi, A.F.J. ; Gibson, J.M. ; Ng, K.K. ; Chantre, A.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.457-468,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
4.

Conference Proceedings
Conference Proceedings
4. ELECTRON TRANSPORT THROUGH EPTAXIAL METAL/SEMI-CONDUCTOR HETEROSTRUCTURES
Levi, A.F.J. ; Tung, R.T. ; Batstone, J.L. ; Gibson, J.M. ; Anzlowar, M. ; Chantre, A.
Pub. info.: Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A..  pp.271-276,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 77
5.

Conference Proceedings
Conference Proceedings
5. CW laser induced deep level defects in virgin silicon
Chantre, A. ; Kechouane, M. ; Bois, D.
Pub. info.: Laser and electron-beam interactions with solids : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.325-330,  1982.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 4
6.

Conference Proceedings
Conference Proceedings
6. MINORITY CARRIER LIFETIME STUDIES IN HALOGEN LAMP RECRYSTALLIZED SOI FILMS
Chantre, A. ; Ronzani, D. ; Vu, D.P.
Pub. info.: Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A..  pp.349-356,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 53
7.

Conference Proceedings
Conference Proceedings
7. (2.2) 1:35 - 2:05 PM - 0.13um SiGeC BiCMOS Technology (Invited)
Chantre, A. ; Laurens, M. ; Chevalier, P. ; Monroy, A. ; Deleglise, F. ; Fellous, C. ; Rubaldo, L. ; Dutartre, D.(ST Microelectronics)
Pub. info.: SiGe: materials, processing, and devices : proceedings of the First international symposium.  pp.33-36,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-07
8.

Conference Proceedings
Conference Proceedings
8. ELECTRICAL CHARACTERIZATION OF BEAM-RECRYSTALLIZED SOI STRUCTURES USING A DEPLETION MODE TRANSISTOR
Vu, D.P. ; Chantre, A. ; Ronzani D. ; Pfister, J.C.
Pub. info.: Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A..  pp.357-364,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 53
9.

Conference Proceedings
Conference Proceedings
9. Is SOI CMOS a promising technology for SOCs in high frequency range? Invited
Raynaud, C. ; Gianesello, F. ; Tinella, C. ; Flatresse, P. ; Gwoziecki, R. ; Touret, P. ; Avenier, G. ; Haendler, S. ; Gonnard, O. ; Gouget, G. ; Labourey, G. ; Pretet, J. ; Marin, M. ; Di Frenza, R. ; Axelrad, D. ; Delatte, P. ; Provins, G. ; Roux, J. ; Balossier, E. ; Vildeuil, J.C. ; Boret, S. ; Van Haaren, B. ; Chevalier, P. ; Boissonnet, L. ; Schwartzmann, T. ; Chantre, A. ; Gloria, D. ; De Foucauld, E. ; Scheer, P. ; Pavageau, C. ; Dambrine, G.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.331-344,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
10.

Conference Proceedings
Conference Proceedings
10. QUENCHED-IN DEFECTS IN CW LASER IRRADIATED VIRGIN SILICON,
Chantre, A. ; Kechouane, M ; Bois, D.
Pub. info.: Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.547-552,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 14