1.

Conference Proceedings
Conference Proceedings
1. Improvement on the surface roughness of microlens array in the excimer laser machining process
Wang,S.-Y. ; Huang,C.-S. ; Chou,H.-Y. ; Lee,T.-Y. ; Chang,R.-S.
Pub. info.: MOEMS and Miniaturized systems II : 22-24 October 2001, San Francisco, USA.  pp.131-138,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4561
2.

Conference Proceedings
Conference Proceedings
2. Surveys and improvements for Internet multicast routing protocols
Lin,J. ; Chang,R.-S.
Pub. info.: Internet routing and quality of service : 2-4 November 1998, Boston, Massachusetts.  pp.306-318,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3529
3.

Conference Proceedings
Conference Proceedings
3. Analysis of CCD moire pattern with the wavelet transform
Chang,R.-S. ; Shen,J.-Y. ; Fan,P.-L.
Pub. info.: Wavelet Applications VI.  pp.420-428,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3723
4.

Conference Proceedings
Conference Proceedings
4. Analysis of primary aberration with the two-dimension discrete wavelet transform
Sheu,J.-Y. ; Chang,R.-S. ; Lin,C.-H.
Pub. info.: Wavelet Applications VII.  pp.372-380,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4056
5.

Conference Proceedings
Conference Proceedings
5. Analysis of third-order spherical aberration with the continuous wavelet transform
Sheu,J.-Y. ; Lin,C.-H. ; Chang,R.-S.
Pub. info.: Wavelet Applications VII.  pp.507-514,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4056