Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China. pp.106-109, 2006. Uetikon-Zuerich. Trans Tech Publications
ANTEC '96 : Plastics-Racing into the Future, May 5-10, Indianapolis : conference proceedings. Vol. 3 pp.3243-3247, 1996. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
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Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Johnson, A.D. ; Entley, W.R. ; Vrtis, R.N. ; Langan, J. ; Maroulis, P. ; Chen, C.M. ; Chen, C.T. ; Chang, Y.C. ; Yam, O.H.
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Environmental issues in the electronics and semiconductor industries : proceedings of the third international symposium. pp.21-32, 2000. Pennington, NJ. Electrochemical Society
Thin film materials, processes, and reliability, plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. pp.237-243, 2003. Pennington, N.J.. Electrochemical Society
Ultrafast phenomena in semiconductors VI : 21, 24-25 January, 2002, San Jose, USA. pp.139-147, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
ANTEC '96 : Plastics-Racing into the Future, May 5-10, Indianapolis : conference proceedings. Vol. 1 pp.917-921, 1996. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
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Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Mion, C. ; Chang, Y.C. ; Muth, J.F. ; Rajagopal, P. ; Brown, J.D.
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GaN and related alloys - 2003 : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.. pp.381-386, 2004. Warrendale, Pa.. Materials Research Society
Park, Minseo ; Carlson, E. ; Chang, Y.C. ; Muth, J.F. ; Bumgarner, J. ; Kolbas, R.M. ; Cuomo, J.J. ; Nemanich, R.J.
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GaN and related alloys - 2002 : symposium held December 2-6, Boston, Massachusetts, U.S.A.. pp.323-330, 2002. Warrendale, Pa.. Materials Research Society
Opsai, J.L. ; Chu, H. ; Wen, Y. ; Chang, Y.C. ; Li, G.
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Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.163-176, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering