1.

Conference Proceedings
Conference Proceedings
1. Dopants in Electroplated Copper
Andricacos, P.C. ; Parks, C. ; Cabral, C. ; Wachnik, R. ; Tsai, R. ; Maihotra, S. ; Locke, P. ; Fluegel, J. ; Horkans, J. ; Kwietniak, K. ; Uzoh, C. ; Rodbell, K.P. ; Gignac, L. ; Walton, E. ; Chung, D. ; Geffren, R.
Pub. info.: Electrochemical processing in ULSI fabrication and semiconductor/metal deposition II : proceedings of the international symposium.  pp.111-121,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-9
2.

Conference Proceedings
Conference Proceedings
2. EFFECT OF OXYGEN EXPOSURE AND DEPOSITION ENVIRONMENT ON THERMAL STABILITY OF Ta BARRIERS TO Cu PENETRATION
Bojarczuk, N.A. ; Clevenger, L.A. ; Holloway, K. ; Harper, J.M.E. ; Cabral, C. ; Schad, R.G. ; Stolt, L.
Pub. info.: Electronic packaging materials science V : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.387-394,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 203
3.

Conference Proceedings
Conference Proceedings
3. DIFFUSE LIGHT SCATTERING AS A PROBE OF BURIED INTERFACE REACTIONS
Pantojas, V. ; Cabral, C. ; Harper, J. ; Persans, P.D.
Pub. info.: Evolution of thin-film and surface microstructure : symposium held November 26-December 1, 1990, Boston, Massachusetts, U.S.A..  pp.701-706,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 202
4.

Conference Proceedings
Conference Proceedings
4. Characterization of Plated Cu Thin Film Microstructures
Beyers, R. B. ; Cabral, C. ; Gignac, L. M. ; Klepeis, S. J. ; Locke, P. S. ; ricacos, P. C. ; Rice, P. M. ; Rodbell, K. P.
Pub. info.: Polycrystalline metal and magnetic thin films : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.209-214,  1999.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 562
5.

Conference Proceedings
Conference Proceedings
5. Mechanisms for Microstructure Evolution in Electroplated Copper Thin Films
Cabral, C. ; Gignac, L. ; Harper, J. N. E. ; Hu, C. K. ; Noyan, I. C. ; ricacos, P. C. ; Rodbell, K. P.
Pub. info.: Polycrystalline metal and magnetic thin films : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.223-228,  1999.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 562
6.

Conference Proceedings
Conference Proceedings
6. Microstructure Evolution During Solid-State Reactions in Polycrystalline Nb/AI and Ti/AI Multilayer Thin Films
Barmak, K. ; Cabral, C. ; Carpenter, D. T. ; Lavoie, C. ; Lucadamo, G. ; Michaelsen, C. ; Rickman, J. M.
Pub. info.: Polycrystalline metal and magnetic thin films : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.159-164,  1999.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 562
7.

Conference Proceedings
Conference Proceedings
7. Fabrication And Performance Limits Of Sub-0.1 μm Cu Interconnects
Kuan, T. ; Inoki, C. ; Oehrlein, G. ; Rose, K. ; Zhao, Y. ; Wang, G. ; Rossnagel, S. ; Cabral, C.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D7.1-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
8.

Conference Proceedings
Conference Proceedings
8. Phase Transformation and Microstructural Properties in Sputtered Versus CVD WSix Films
Domenicucci, A. ; Dehm, C. ; Loh, S. ; Clevenger, L. A. ; Dziobkowski, C. ; Cabral, C. ; Lavoie, C. ; Jorden-Sweet, J.
Pub. info.: Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.3-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 441