1.

Conference Proceedings
Conference Proceedings
1. Comparison of thresholding techniques on nanoparticle images
J. DaPonte ; T. Sadowski ; C. C. Broadbridge ; D. Day ; A. Lehman ; D. Krishna ; L. Marinella ; P. Munhutu ; M. Sawicki
Pub. info.: Visual information processing XVI : 10 April 2007, Orlando, Forida [i.e. Florida], USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6575
2.

Conference Proceedings
Conference Proceedings
2. Application of particle analysis to transmission electron microscopy (TEM)
J. DaPonte ; T. Sadowski ; C. C. Broadbridge ; D. Day ; A. H. Lehman ; D. Krishna ; L. Marinella ; P. Munhutu ; M. Sawicki
Pub. info.: Visual information processing XVI : 10 April 2007, Orlando, Forida [i.e. Florida], USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6575
3.

Conference Proceedings
Conference Proceedings
3. Characterization of nanoparticles by computer imaging particle analysis
J. DaPonte ; T. Sadowski ; C. C. Broadbridge ; P. Munhutu ; A. Lehman
Pub. info.: Nanomaterial synthesis, interfacing, and intergrating devices, circuits, and systems II : 9 and 11 Septermber 2007, Boston, Massachusetts, USA.  pp.676807-1-676807-8,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6768