1.

Conference Proceedings

Conference Proceedings
Bruijn,M.P. ; Tiest,W.B. ; Hoevers,H.F.C. ; Kuur,J.van der ; Mels,W.A. ; Korte,P.A.J.de
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.145-153,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
2.

Conference Proceedings

Conference Proceedings
Korte,P.A.J.de ; Hoevers,H.F.C. ; Bruijn,M.P. ; Bento,A.C. ; Mels,W.A. ; Bleeker,J.A.M. ; Holland,A.D. ; Turner,M.J.T.
Pub. info.: X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado.  pp.152-161,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3766
3.

Conference Proceedings

Conference Proceedings
Korte,P.A.J.de ; Berg,M.L.van den ; Bruijn,M.P. ; Gomez,J. ; Kiewiet,F. ; Lieshout,H.L.van ; Luiten,O.J. ; Brons,C.G.S. ; Flokstra,J. ; Hamster,A.W.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado.  pp.506-515,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2808