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Conference Proceedings

1. Jules Verne: a new polishing technique related to FJP

Booij, S.M. ; Faehnle, O.W. ; Meeder, M. ; Wons, T. ; Braat, J.J.M.

Pub. info.:	Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.89-100, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5180

Conference Proceedings

2. Optimization of polishing processes by using iTIRM for in situ monitoring of surface quality

Meeder, M. ; Mauret, T. ; Booij, S.M. ; Braat, J.J.M. ; Faehnle, O.W.

Pub. info.:	Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.40-46, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5180

Conference Proceedings

3. Local optimization strategies to escape from poor local minima

Bociort, F. ; Serebriakov, A. ; Braat, J.J.M.

Pub. info.:	International optical design conference 2002 : 3-5 June, 2002, Tucson, Arizona, USA. pp.218-225, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4832

Conference Proceedings

4. Influence of multilayers on the optical performance of extreme-ultraviolet projection systems

Bal, M.F. ; Bociort, F. ; Braat, J.J.M.

Pub. info.:	International optical design conference 2002 : 3-5 June, 2002, Tucson, Arizona, USA. pp.149-157, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4832

Conference Proceedings

5. Fast-sampling multipixel detector for a heterodyne interferometer with angstrom precision

Soloviev, O. ; Vdovin, G.V. ; Krieg, L.M. ; Monteiro, D.W.L. ; Braat, J.J.M. ; French, P.J.

Pub. info.:	Photonics, devices, and systems II :Proceedings from PHOTONICS PRAGUE 2002, 26-29 May 2002, Prague, Czech Republic, Miroslav Hrabovský, Dagmar Senderáková, Pavel Tománek, chairs/editors ; Organized by CSSF--Czech and Slovak Society for Photonics, Tech-Market. pp.25-30, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5036

Conference Proceedings

6. Experimental determination of lens aberrations from the intensity point-spread function in the focal region

Dirksen, P. ; Braat, J.J.M. ; Janssen, A.J.E.M. ; Juffermans, C.A.H. ; Leeuwestein, A.

Pub. info.:	Optical Microlithography XVI. Part One pp.1-10, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5040

Conference Proceedings

7. New concept for wide-field imaging

Montilla, I. ; Bakker, E.J. ; Pereira, S.F. ; Braat, J.J.M.

Pub. info.:	Interferometry for Optical Astronomy II. Part One pp.416-424, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4838

Conference Proceedings

8. Characterization of the frequency-modulated continuous wave subsystem of an angstrom-accuracy absolute interferometer

Krieg, L.M. ; Swinkels, B.L. ; Braat, J.J.M.

Pub. info.:	Interferometry XI: Applications. pp.131-141, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4778

Conference Proceedings

9. Wavelength-shifted reconstruction with bacteriorhodopsin for holographic particle image velocimetry

Koek, W.D. ; Barnhart, D. ; Chan, V.S.S. ; Bhattacharya, N. ; Juchem, T. ; Hampp, N. ; Westerweel, J. ; Braat, J.J.M.

Pub. info.:	Organic Holographic Materials and Applications. pp.147-155, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5216

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Conference Proceedings

10. Inverse propagation algorithm for angstrom accuracy interferometer (Invited Paper)

Krieg, M.L. ; Braat, J.J.M.

Pub. info.:	Interferometry XII: Techniques and Analysis. pp.250-263, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5531

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Author: Braat, J.J.M.