1.

Conference Proceedings
Conference Proceedings
1. EVALUATION OF LARGE DIAMETER InP SUBSTRATE MATERIAL
Trapp, K. D. C. ; Asom, M. T. ; Carver, G. E. ; Monberg, E. M. ; Thiel, F. A. ; Bams, R. L.
Pub. info.: III-V heterostructures for electronic/photonic devices : symposium held April 24-27, 1989, San Diego, California, U.S.A..  pp.499-506,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 145
2.

Conference Proceedings
Conference Proceedings
2. PROPERTIES OF MBE GROWN HETEROSTRUCTURES OF GaAs/InSb AND InP/InSb
Asom, M. T. ; Fitzgerald,m E. A. ; Thiel,. F. A. ; People, R,. ; Eaglesham. D. ; Luther, L. ; Sputz, S. K. ; Kimerling, L. C.
Pub. info.: III-V heterostructures for electronic/photonic devices : symposium held April 24-27, 1989, San Diego, California, U.S.A..  pp.399-404,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 145
3.

Conference Proceedings
Conference Proceedings
3. IDENTIFICATION OF INTERSTITIAL CARBON RELATED DEFECTS IN SILICON
Benton, J. L. ; Asom, M. T. ; Sauer, R. ; Kimerling, L. C.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.85-92,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
4.

Conference Proceedings
Conference Proceedings
4. THERMAL ANNEALING AND COOLING-RATE DEPENDENT ELECTRONIC PROPERTIES OF BULK GaAs CRVSTALS
Parsey Jr., J. M. ; Asom, M. T. ; Kimerling, L. C. ; Sauer, R. ; Thiel, F. A.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.429-436,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104