1.

Conference Proceedings
Conference Proceedings
1. A WEAK BEAM IMAGING TECHNIQUE FOR THE CHARACTERIZATION OF INTERFACIAL ROUGHNESS IN (InGa)As/GaAs STRAINED LAYER STRUCTURES
Yao, J.Y. ; Andersson, T.G. ; Dunlop, G.L.
Pub. info.: Atomic scale structure of interfaces : symposium held November 27-29, 1989, Boston Massachusetts, U.S.A..  pp.345-350,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 159
2.

Conference Proceedings
Conference Proceedings
2. Optical Properties of Some GaAs-Based Quantum Structures with Excess Carriers
Holtz, P.O ; Wongmnerod, S. ; Sernelius, B. ; Pozina, G. ; Bergman, J.P. ; Madsen, L.D. ; McCaffrey, J.P. ; Reginski, K. ; bugajski, M. ; Godlewski, M. ; thordson, J. ; Andersson, T.G.
Pub. info.: Compound semiconductor power transistors and : State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXIX).  pp.145-156,  1998.  Pennington, N. J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-12
3.

Conference Proceedings
Conference Proceedings
3. Microstructural Characterization of GaN-GaAs Alloys Grown on (001) GaAs by Molecular Beam Epitaxy
Kim, Hyonju ; Andersson, T.G. ; Sodervall, U. ; Jager, C. ; Jager, W. ; Albrecht, M. ; Bosker, G. ; Stolwijk, N.A.
Pub. info.: GaN and related alloys - 2001 : symposium held November 26-30, 2001, Boston, Massachusetts, U.S.A..  pp.165-170,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 693
4.

Conference Proceedings
Conference Proceedings
4. Pinning of Landau levels in open two dimensional electron systems
Popov, V.G. ; Dubrovskii, Yu.V. ; Vdovin, E.E. ; Khanin, Yu.N. ; Portal, J.-C. ; Maude, D.K. ; Andersson, T.G. ; Wang, S.M.
Pub. info.: 10th International Symposium on Nanostructures: Physics and Technology.  pp.294-297,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5023