1.

Conference Proceedings
Conference Proceedings
1. AN UPDATED GAS SOURCE FOCUSED ION BEAM INSTRUMENT FOR TEM SPECIMEN PREPARATION
Alani, R. ; Jones, J. S. ; Swann, P. R.
Pub. info.: Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A..  pp.65-78,  1992.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 254
2.

Conference Proceedings
Conference Proceedings
2. PRECISION ION POLISHING SYSTEM-A NEW INSTRUMENT FOR TEM SPECIMEN PREPARATION OF MATERIALS
Alani, R. ; Swann, P. R.
Pub. info.: Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A..  pp.43-64,  1992.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 254
3.

Conference Proceedings
Conference Proceedings
3. *Chemically Assisted Ion Beam Etching (CAIBE) - a New Technique for TEM Specimen Preparation of Materials
Alani, R. ; Jones, J. ; Swann, P.
Pub. info.: Specimen preparation for transmission electron microscopy of materials--II : symposium held April 19-20, 1990, San Francisco, California, U.S.A..  pp.85-102,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 199
4.

Conference Proceedings
Conference Proceedings
4. An Updated Ion-Polishing System for TEM Specimen Preparation of Materials
Alani, R. ; Mitro, R. J. ; Swann, P. R.
Pub. info.: Specimen preparation for transmission electron microscopy of materials IV : symposium held April 2, 1997, San Francisco, California, U.S.A..  pp.263-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 480