1.

Conference Proceedings
Conference Proceedings
1. Differential Suicide Thickness for ULSI Scaling*
Taylor, W.J., Jr. ; Smith, I. ; Nguyen, J.-Y. ; Rai, R. ; Adetutu, O. ; Geren, J. ; Ybarra, J. ; Petru, D.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.278-287,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-6
2.

Conference Proceedings
Conference Proceedings
2. Advanced CVD Barrier Technology for Copper Interconnect
Jain, A. ; Adetutu, O. ; Ekstrom, B. ; Hamilton, G. ; Herrick, M. ; Venkatraman, R. ; Weitzman, E.
Pub. info.: Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A..  pp.269-,  1999.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 564
3.

Conference Proceedings
Conference Proceedings
3. Annealing Behaviour of WSix Films Prepared By CVD
Katiyar, M. ; Samal, G.S. ; Gupta, R.K. ; Deepak ; Sahoo, P.K. ; Kulkarn, V.N. ; Adetutu, O.
Pub. info.: Gate stack and silicide issues in silicon processing II : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2002.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 670