Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA. pp.270-280, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA. pp.109-117, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG. pp.234-240, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG. pp.224-233, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
UV/EUV and visible space instrumentation for astronomy and solar physics : 1-2 August 2001, San Diego, USA. pp.101-110, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Interferometry '99 : techniques and technologies : 20-23 September 1999, Pułtusk, Poland. pp.54-64, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA. Part B pp.314-320, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing. pp.118-127, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Physics and Simulation of Optoelectronic Devices VI. Part 1 pp.162-170, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering