1.

Conference Proceedings
Conference Proceedings
1. Adjustment of Microwave Integrated Circuit (MIC) with Focused Ion Beam (FIB)
L.B. Zoccal ; A. Vaz ; S.D. Yamamoto ; S. Moschkalev ; J.A. Diniz
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.131-136,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)
2.

Conference Proceedings
Conference Proceedings
2. Electrical Characterization of Multi-Walled Carbon Nanotubes in 2 and 4 Terminals Configurations
J. Leon ; S.A. Moshkalev ; A. Flacker ; A. Vaz ; C. Veríssimo
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.423-432,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)
3.

Conference Proceedings
Conference Proceedings
3. Fabrication of Multi-point Test Structures Using Focused Ion Beam and Selective Carbon Nanotubes Deposition by Dielectrophoresis
M.M. Silva ; A. Vaz ; C. Veríssimo ; S.A. Moshkalev ; J.W. Swart
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.473-475,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)