
Adhesion Properties of PMSSQ-Based Low Dielectric Constant Films by Modified Edge Lift-Off Test
- 著者名:
Kim, Y.D. Sin, D.S. Moon, M.S. Kang, J.W. Nam, H.Y. Choi, B.K. Kang, K.K. Ko, M.J. - 掲載資料名:
- Thin film materials, processes, and reliability : proceedings of the international symposium
- シリーズ名:
- Electrochemical Society Proceedings Series
- シリーズ巻号:
- 2001-24
- 発行年:
- 2001
- 開始ページ:
- 185
- 終了ページ:
- 192
- 総ページ数:
- 8
- 出版情報:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773577 [1566773571]
- 言語:
- 英語
- 請求記号:
- E23400/200124
- 資料種別:
- 国際会議録
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