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Advanced process control for deep sub-100nm gate fabrication

Author(s):
Goto, T. K. ( Fujitsu Ltd. (Japan) )
Tajima, M. ( Fujitsu Ltd. (Japan) )
Harada, F. ( Fujitsu Ltd. (Japan) )
Kato, T. ( Fujitsu Ltd. (Japan) )
Yamazaki, T. ( Fujitsu Ltd. (Japan) )
Taguchi, T. ( Fujitsu Ltd. (Japan) )
1 more
Publication title:
Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5755
Pub. Year:
2005
Page(from):
18
Page(to):
28
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819457356 [0819457353]
Language:
English
Call no.:
P63600/5755
Type:
Conference Proceedings

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