Manufacturing metrology
- 責任表示:
- presented at the Winter Annual Meeting of the American Society of Mechanical Engineers, Chicago, Illinois, November 27 - December 2, 1988 ; sponsored by the Production Engineering Division, ASME ; edited by G. Sathyanarayanan, V. Radhakrishnan, J. Raja
- シリーズ名:
- ASME Symposia Volumes
- シリーズ巻号:
- PED 29
- 出版情報:
- New York, NY: American Society of Mechanical Engineers, 1988
- 請求記号:
- A11710/890897
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Kluwer |