Blank Cover Image

5th International Conference on Micro- and Nanosystems : 8th International Conference on Design and Design Education : 21st Reliability, Stress Analysis, and Failure Prevention Conference : presented at ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, August 28-31, 2011, Washington, D.C.

責任表示:
sponsored by the Design Engineering Division, ASME, the Computers and Information in Engineering Division, ASME
シリーズ名:
ASME Symposia Volumes
シリーズ巻号:
DETC 2011(7)
出版情報:
New York, NY: American Society of Mechanical Engineers, 2012
ISBN:
9780791854846 [0791854841]
請求記号:
A11633/201107
資料種別:
国際会議録
巻号一覧
Loading volume number list

類似資料:

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12