ISTFA 2007 : conference proceedings from the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San José McEnery Convention Center San José, California, USA
- 責任表示:
- sponsored by EDFAS, ISTFA, ASM International
- シリーズ名:
- ASM International Conference Proceedings
- シリーズ巻号:
- 33rd
- 出版情報:
- Materials Park, OH: ASM International, 2007
- ISBN:
- 9780871708632 [0871708639]
- 請求記号:
- A11375/33
- 資料種別:
- 国際会議録
