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ISTFA 2005 : conference proceedings from the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center San Jose, California

責任表示:
sponsored by EDFAS, ISTFA, ASM International
シリーズ名:
ASM International Conference Proceedings
シリーズ巻号:
31st
出版情報:
Materials Park, OH: ASM International, 2005
ISBN:
9780871708236 [087170823X]
請求記号:
A11375/31
資料種別:
国際会議録
巻号一覧
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