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ISTFA 2000 : proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington

責任表示:
sponsored by EDFAS
シリーズ名:
ASM International Conference Proceedings
シリーズ巻号:
26th
出版情報:
Materials Park, OH: ASM International, 2000
ISBN:
9780871707017 [0871707012]
請求記号:
A11375/26
資料種別:
国際会議録
巻号一覧
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