ISTFA '91 : proceedings of the 17th International Symposium for Testing & Failure Analysis | 東京科学大学図書館資料名データベース

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ISTFA '91 : proceedings of the 17th International Symposium for Testing & Failure Analysis

責任表示:: sponsored by the Electronic Materials and Processing Division of ASM International
シリーズ名:: ASM International Conference Proceedings
シリーズ巻号:: 17th
出版情報:: Materials Park, OH: ASM International, 1991
ISBN:: 9780871704368 [0871704366]
請求記号:: A11375/17
資料種別:: 国際会議録

巻号一覧

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詳細

TDL書誌ID:	ZA00062804
シリーズＩＤ:	PA00000267
会議名:	International Symposium for Testing and Failure Analysis (ISTFA)
回次:	17th
会議開催地:	Los Angeles, CA, USA
会議開催年:	1991.11.11-1991.11.15

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