Blank Cover Image

Microelectronic failure analysis : desk reference

責任表示:
Thomas W. Lee, editor, Seshu V. Pabbisetty, editor
シリーズ名:
ASM International Conference Proceedings
出版情報:
Materials Park, OH: ASM International, 1993
ISBN:
9780871704795 [087170479X]
請求記号:
A11370/941489
資料種別:
国際会議録
巻号一覧
Loading volume number list

類似資料:

1 国際会議録 Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV

SPIE-The International Society for Optical Engineering
7 国際会議録 Failure and damage analysis of advanced materials

Springer-Verlag
2 国際会議録 Microelectronic Manufacturing Yield, Reliability, and Failure Analysis

SPIE-The International Society for Optical Engineering
8 国際会議録 ISTFA '91 : proceedings of the 17th International Symposium for Testing & Failure Analysis

ASM International
3 国際会議録 Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II

SPIE-The International Society for Optical Engineering
9 国際会議録 13th Biennial Conference on Reliability, Stress Analysis, and Failure Prevention

American Society of Mechanical Engineers
4 国際会議録 Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III

SPIE-The International Society for Optical Engineering
10 国際会議録 Failure analysis : techniques and applications : proceedings of the First International Conference on Failure Analysis, 8-11 July 1991, Montreal, Quebec, Canada

ASM International
5 国際会議録 In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK

SPIE-The International Society for Optical Engineering
11 国際会議録 Surface and interface analysis of microelectronic materials processing and growth, 12-13 October 1989, Santa Clara, California

Society of Photo-optical Instrumentation Engineers
6 国際会議録 Information systems : failure analysis

Springer-Verlag
12 国際会議録 Reliability, stress analysis, and failure prevention : presented at the 1991 ASME design technical conferences, 9th Biennial Conference on Reliability, Stress …

American Society of Mechanical Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12