Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics : Gaithersburg, Maryland, 27-29 March 2007
- 責任表示:
- editors, David G. Seiler ... [et al.] ; sponsoring organizations, National Institute of Standards and Technology ... [et al.]
- シリーズ名:
- AIP conference proceedings
- シリーズ巻号:
- 931
- 出版情報:
- New York: American Institute of Physics, 2007
- ISSN:
- 0094243X
- ISBN:
- 9780735404410 [0735404410]
- 請求記号:
- A08800/931
- 資料種別:
- 国際会議録
類似資料:
|
American Institute of Physics | |
|
American Institute of Physics |
SPIE - The International Society of Optical Engineering |
|
American Institute of Physics |
American Society of Mechanical Engineers |
|
American Institute of Physics | |
