Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000
- 責任表示:
- T 2000, Upton, N.Y. 5-8 November 2000
- シリーズ名:
- AIP conference proceedings
- シリーズ巻号:
- 572
- 出版情報:
- New York: American Institute of Physics, 2001
- ISSN:
- 0094243X
- ISBN:
- 9780735400115 [0735400113]
- 請求記号:
- A08800/572
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
International Symposium on Electron Beam Ion Sources and Their Applications, Upton, N.Y. 1988
American Institute of Physics |
American Institute of Physics |
American Institute of Physics |
Materials Research Society |
Association for Computing Machinery |
Kluwer Academic Publishers |
American Institute of Physics |
Society of Photo-optical Instrumentation Engineers |