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Electron beam ion sources and traps and their applications : eighth international symposium EBIS/T 2000, Upton, N.Y. 5-8 November 2000

責任表示:
T 2000, Upton, N.Y. 5-8 November 2000
シリーズ名:
AIP conference proceedings
シリーズ巻号:
572
出版情報:
New York: American Institute of Physics, 2001
ISSN:
0094243X
ISBN:
9780735400115 [0735400113]
請求記号:
A08800/572
資料種別:
国際会議録
巻号一覧
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類似資料:

Society of Photo-optical Instrumentation Engineers

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