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X-ray microscopy : proceedings of the 6th International Conference, Berkeley, CA, 2-6 Aug. 1999

責任表示:
editors, Werner Meyer-Ilse, Tony Warwick, David Attwood
シリーズ名:
AIP conference proceedings
シリーズ巻号:
507
出版情報:
New York: American Institute of Physics, 2000
ISSN:
0094243X
ISBN:
9781563969263 [1563969262]
請求記号:
A08800/507
資料種別:
国際会議録
巻号一覧
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