
Low energy X-ray diagnostics--1981 (Monterey)
- 責任表示:
- edited by David T. Attwood, Burton L. Henke
- シリーズ名:
- AIP conference proceedings
- シリーズ巻号:
- 75
- 出版情報:
- New York: American Institute of Physics, 1981
- ISSN:
- 0094243X
- ISBN:
- 9780883181744 [0883181746]
- 請求記号:
- A08800/75
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
American Institute of Physics |
SPIE - The International Society for Optical Engineering |
Kluwer Academic Publishers | |
Society of Photo-optical Instrumentation Engineers |
D.Reidel Publishing Company |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |