Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies (WREFT 08) : Ischia, Italy, 5 May 2008 | 東京科学大学図書館資料名データベース

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Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies (WREFT 08) : Ischia, Italy, 5 May 2008

シリーズ名:: ACM Conference Proceedings
シリーズ巻号:: WREFT 2008
出版情報:: New York: Association for Computing Machinery, 2008
ISBN:: 9781605609027 [1605609021]
請求記号:: A04500/2008
資料種別:: 国際会議録

巻号一覧

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詳細

TDL書誌ID:	ZA00059470
シリーズＩＤ:	PA00000044
会議名:	Workshop on Radiation Effects and Fault Tolerance in Nanometer Technologies : WREFT
回次:	2008
会議開催地:	Ischia, Italy
会議開催年:	2008.05.05

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