Blank Cover Image

1st joint WOSP/SIPEW international conference on performance engineering 2010 : (WOSP/SIPEW 10) : San Jose, California, USA : 28-30 January 2010

責任表示:
SIPEW international conference on performance engineering 2010 : (WOSP
シリーズ名:
ACM Conference Proceedings
シリーズ巻号:
WOSP 2010
出版情報:
New York: Association for Computing Machinery, 2010
ISBN:
9781615678914 [1615678913]
請求記号:
A04497/2010
資料種別:
国際会議録
巻号一覧
Loading volume number list

類似資料:

1 国際会議録 Image quality and system performance V : 28-30 January 2008, San Jose, California, USA

Society of Photo-optical Instrumentation Engineers
7 国際会議録 Vision geometry XV : 30 January and 1 February [2007], San Jose, California, USA

SPIE - The International Society of Optical Engineering
2 国際会議録 Image quality and system performance IV : 30 January-1 February 2007, San Jose, California, USA

SPIE - The International Society of Optical Engineering
8 国際会議録 Document recognition and retrieval XIV : 30 January-1 February 2007, San Jose, California, USA

SPIE - The International Society of Optical Engineering
3 国際会議録 Cases 2003 : International Conference on Compilers, Architecture, and Synthesis for Embedded Systems, October 30 - November 1, 2003, San Jose, California, USA

ACM Press
9 国際会議録 Sensors, cameras, and systems for scientific/industrial applications VIII : 30 January-1 February 2007, San Jose, California, USA

SPIE - The International Society of Optical Engineering
4 国際会議録 Commercial and biomedical applications of ultrafast lasers III : 28-30 January 2003, San Jose, California, USA

SPIE-The International Society for Optical Engineering
10 国際会議録 Visual communications and image processing 2007 : 30 January-1 February 2007, San Jose, California, USA

SPIE - The International Society of Optical Engineering
5 国際会議録 Security, forensics, steganography, and watermarking of multimedia contents X : 28-30 January 2008, San Jose, California, USA

Society of Photo-optical Instrumentation Engineers
11 国際会議録 Optical engineering at the Lawrence Livermore National Laboratory :30 January 2003, San Jose, California, USA

SPIE-The International Society for Optical Engineering
6 国際会議録 Color imaging XII : processing, hardcopy, and applications : 30 January-1 February 2007, San Jose, California, USA

SPIE - The International Society of Optical Engineering
12 国際会議録 Proceedings of the STLE/ASME International Joint Tribology Conference--2010 : presented at STLE/ASME International Joint Tribology Conference, October 17-20, …

American Society of Mechanical Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12