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Time-resolved electron and X-Ray diffraction : 13-14 July 1995, San Diego, California

責任表示:
Peter M. Rentzepis, editor
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2521
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1996
ISSN:
0277786X
ISBN:
9780819418807 [0819418803]
請求記号:
P63600/2521
資料種別:
国際会議録
巻号一覧
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