Scanning probe microscopies III : 6-7 February 1995, San Jose, California | 東京工業大学附属図書館資料名データベース

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Scanning probe microscopies III : 6-7 February 1995, San Jose, California

責任表示:: Chair, Editor Medhi Vaez-Iravani
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 2384
出版情報:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1995
ISSN:: 0277786X
ISBN:: 9780819417312 [0819417319]
請求記号:: P63600/2384
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00057587
シリーズＩＤ:	PA00000029
会議名:	Symposium on scanning probe microscopies
回次:	3rd
会議開催地:	San Jose, CA, USA
会議開催年:	1995.02.06-1995.02.07

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