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Microelectronics manufacturability, yield, and reliability : 20-21 October 1994, Austin, Texas

責任表示:
Barbara Vasquez, Hisao Kawasaki, chairs
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2334
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1994
ISSN:
0277786X
ISBN:
9780819416674 [0819416673]
請求記号:
P63600/2334
資料種別:
国際会議録
巻号一覧
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