Blank Cover Image

Proceedings of the 1993 International Symposium on Microelectronics, November 9-11, 1993, Dalls Convention Center, Dallas, Texas

責任表示:
sponsored by the International Society for Hybrid Microelectronics
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
2105
出版情報:
Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1993
ISSN:
0277786X
ISBN:
9780819413918 [0819413917]
請求記号:
P63600/2105
資料種別:
国際会議録
巻号一覧
Loading volume number list

類似資料:

1 国際会議録 Proceedings, 2003 International Symposium on Microelectronics, November 18-20, 2003, Hynes Convention Center, Boston, Massa Massachusetts, USA

SPIE-The International Society for Optical Engineering
7 国際会議録 ISTFA 2001 : conference proceedings fromf the 27th international symposium for testing and failure analysis : 11-15 November 2001, Santa Clara Convention …

ASM International
2 国際会議録 ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis, November 9-13, 2014, George R. Brown Convention …

ASM International
8 国際会議録 ISTFA 2012 : conference proceedings from the 38th international symposium for testing and failure analysis : November 11-15, 2012, Phoenix Convention Center, …

ASM International
3 国際会議録 Proceedings : 2000 International Symposium on Microelectronics, September 20-22, 2000, Hynes Convention Center, Boston, Massachusetts

IMAPS
9 国際会議録 Proceedings of the 11th International Modal Analysis Conference : February 1-4, 1993, Hyatt Orland Hotel and Convention Center, Kissimmee, Florida

Society of Photo-optical Instrumentation Engineers
4 国際会議録 Proceedings : 1995 International Symposium on Microelectronics, October 24-26, 1995, Los Angels Convention Center, Los Angeles, California

SPIE-The International Society for Optical Engineering
10 国際会議録 Proceedings of the 11th Symposium on Space Nuclear Power and Propulsion , Albuquerque Convention Center, Albuquerque, New Mexico, January 9 - 13, 1994

American Institute of Physics
5 国際会議録 Proceedings : 1997 International Symposium on Microelectronics : 14-16 October 1997, Pennsylvania Convention Center Philadelphia, Pennsylvania

IMAPS
11 国際会議録 ISTFA '98 : Proceedings of the 24th International Symposium for Testing and Failure Analysis, 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas

ASM International
6 国際会議録 Proceedings : 2002 International Symposium on Microelectronics : September 4-6, 2002, Colorado Convention Center, Denver, CO

IMAPS
12 国際会議録 ISTFA 2010 : conference proceedings from the 36th international symposium for testing and failure analysis : November 14-18, 2010, InterContinental Hotel Dallas …

ASM International
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12