Interferometry : surface characterization and testing : 24 July 1992, San Diego, California | 東京工業大学附属図書館資料名データベース

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Interferometry : surface characterization and testing : 24 July 1992, San Diego, California

責任表示:: Katherine Creath, John E. Greivenkamp, chairs
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 1776
出版情報:: Bellingham, WA: Society of Photo-optical Instrumentation Engineers, 1992
ISSN:: 0277786X
ISBN:: 9780819409492 [0819409499]
請求記号:: P63600/1776
資料種別:: 国際会議録

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詳細

TDL書誌ID:	ZA00056998
シリーズＩＤ:	PA00000029
会議名:	Symposium on interferometry
回次:	1992
会議開催地:	San Diego, CA, USA
会議開催年:	1992.07.24

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